Ключевые слова: measurement technique, acoustic emission, HTS, coils, Bi2223, design parameters, insulating medium, crack formation, experimental results
Sohma M., Yamaguchi I., Kondo W., Tsukada K., Kumagai T., Nakagawa Y., Manabe T., Kamiya K., Hikata T., Matsui H.
Ключевые слова: HTS, YBCO, fabrication, films thick, fluorine-free process, MOD process, substrate SrTiO3, buffer layers, solution techniques, microstructure
Higuchi N., Sohma M., Yamaguchi I., Kondo W., Kumagai T., Yamasaki H., Nakagawa Y., Kaiho K., Arai K., Matsui H., Natori N.
Ключевые слова: HTS, YBCO, films large-area, MOD process, substrate sapphire, FCL resistive, matrix, shunt, short circuit test, high voltage process, power equipment
Ключевые слова: HTS, YBCO, films, FCL resistive, shunt, normal zone propagation, overcurrent, temperature distribution, experimental results, power equipment
Yamasaki H., Nakagawa Y., Develos-Bagarinao K.(develos-bagarinao@aist.go.jp), Ohki K.
Ключевые слова: FCL resistive, shunt, HTS, YBCO, films, overcurrent, experimental results, power equipment
Ключевые слова: HTS, YBCO, films thick, substrate sapphire, buffer layers, microstructure, fabrication
Furuse M., Nakagawa Y., Yamasaki H.(h.yamasaki@aist.go.jp), Kaiho K., Arai K.
Ключевые слова: FCL resistive, HTS, YBCO, films epitaxial, substrate sapphire, design parameters, economic analysis, experimental results, power equipment
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, substrate sapphire, buffer layers, crack formation, Jc/B curves, thickness dependence, fabrication, critical caracteristics
Develos-Bagarinao K.(kathy@ni.aist.go.jp), Yamasaki H., Nakagawa Y., Nie J.C.
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, films epitaxial, substrate single crystal, buffer layers, PLD process, microstructure, Jc/B curves, critical caracteristics, fabrication
Yamasaki H., Nakagawa Y., Nie J.C., Murugesan M., Mawatari Y., Develos-Bagarinao K.(develos-bagarinao@aist.go.jp)
Yamasaki H., Nakagawa Y., Obara H., Nie J.C., Murugesan M., Bagarinao K.D.(kathy@ni.aist.go.jp)
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Develos-Bagarinao K.(kathy@ni.aist.go.jp), Yamasaki H., Nakagawa Y., Endo K.
Ключевые слова: HTS, YBCO, films large-area, phase formation, fabrication
Furuse M., Nakagawa Y., Yamasaki H.(h.yamasaki@aist.go.jp)
Ключевые слова: HTS, YBCO, films, FCL resistive, current waveforms, power equipment
Yamasaki H., Nakagawa Y., Murugesan M.(m.murugesan@aist.go.jp), Obara H., Kosaka S., Nie J.C.
Ключевые слова: HTS, REBCO, films, PLD process, fabrication, critical current density, heat treatment, temperature dependence, YBCO, experimental results, critical caracteristics
Develos-Bagarinao K.(kathy@ni.aist.go.jp), Yamasaki H., Nakagawa Y., Endo K.
Ключевые слова: HTS, YBCO, films large-area, PLD process, surface, microstructure, composition, fabrication, critical current density, FCL resistive, power equipment, critical caracteristics
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